Photoelectrochemical and physical properties of titanium dioxide films obtained by aerosol pyrolysis

Materials Research Bulletin

Volumn 39, Issue 4-5, 2004, Pages 599-608

  Belaidi, A ^a   Chaqour, S M ^a   Gorochov, O ^a   Neumann Spallart, M ^a  

^a Centre National de la Recherche Scientifique   (France)

Author keywords

A. Oxides; A. Semiconductors; A. Thin films; D. Electrochemical properties; D. Optical properties

Indexed keywords

AEROSOLS; ANNEALING; CATALYSTS; ELECTROLYTES; PHOTOCHEMICAL REACTIONS; PHOTONS; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

PHOTOELECTROCHEMICAL PROPERTIES; PHOTON FLUX;

THIN FILMS;

EID: 1642292342     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2003.12.012     Document Type: Article

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