High-pressure and high-temperature polymorphism in silica

High Pressure Research

Volumn 23, Issue 1-2 SPEC. ISS., 2003, Pages 35-39

  Dubrovinsky, L S ^a   Dubrovinskaia, N A ^a   Prakapenka, V ^b   Seifert, F ^a   Langenhorst, F ^a   Dmitriev, V ^c   Weber, H P ^c   Le Bihan, T ^c  

^a UNIVERSITÄT BAYREUTH   (Germany)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

High pressure; Silica; Structure; X ray diffraction

Indexed keywords

CHARGE COUPLED DEVICES; CRYSTALLIZATION; DETECTORS; HIGH PRESSURE EFFECTS; MIXTURES; QUENCHING; X RAY DIFFRACTION ANALYSIS;

EDGE-SHEARING; POLYMORPHISMS; POWDER DIFFRACTIONS; SHOCK WAVE COMPRESSION;

SILICA;

EID: 1642288174     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: 10.1080/0895795031000109706     Document Type: Conference Paper

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