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Volumn 42, Issue 12, 2003, Pages 3595-3599
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High speed three-dimensional profilometry utilizing laser diode arrays
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER CONTROL SYSTEMS;
LASER BEAMS;
LIGHT SOURCES;
LIGHT VELOCITY;
OPTICAL VARIABLES MEASUREMENT;
PULSED LASER APPLICATIONS;
SCANNING;
THREE DIMENSIONAL;
FRINGE PROTECTION TECHNIQUE;
HIGH SPEED PROFILOMETRY;
LASER DIODE ARRAY;
THREE DIMENSIONAL PROFILOMETRY;
SEMICONDUCTOR LASERS;
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EID: 1642265760
PISSN: 00913286
EISSN: None
Source Type: Journal
DOI: 10.1117/1.1621408 Document Type: Article |
Times cited : (1)
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References (9)
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