Dimensional effects on the reliability of polycrystalline silicon thin-film transistors

Microelectronics Reliability

Volumn 40, Issue 8-10, 2000, Pages 1479-1483

  Zan, H W ^a   Shih, P S ^a   Chang, T C ^b,c   Chang, C Y ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

^c NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 16344382380     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00165-7     Document Type: Article

References (8)

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