Deformation measurements using mutual information: Principle and applications

Optics and Lasers in Engineering

Volumn 43, Issue 8, 2005, Pages 895-903

  Wang, S B ^a   Li, X Y ^a   Cao, Y D ^a   Dong, D S ^a   Tong, J W ^a   Li, L A ^a   Yue, C ^a   Shen, M ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Digital image processing; Displacement fields; Mutual information; Probability; Sub pixel

Indexed keywords

ALGORITHMS; BENDING (DEFORMATION); CORRELATION METHODS; IMAGE PROCESSING; INFORMATION ANALYSIS; PATTERN RECOGNITION; PROBABILITY; SPECKLE;

DIGITAL SPECKLE CORRELATION METHODS (DSCM); DISPLACEMENT FIELDS; MUTUAL INFORMATIONS; SUB-PIXELS;

DEFORMATION;

EID: 16344371131     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2004.09.007     Document Type: Conference Paper

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