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Volumn , Issue , 2004, Pages 105-106

Low loss silicon window material for submillimeter waves using micromachined artificial dielectrics for anti-reflection coating

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; BANDWIDTH; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE POLARIZATION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MICROMACHINING; PERMITTIVITY; SUBMILLIMETER WAVES; VACUUM;

EID: 16244421731     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (5)
  • 2
    • 0037725209 scopus 로고    scopus 로고
    • Scattering of submillimeter radiation from rough surfaces: Absorbers and diffuse reflectors for HIFI and PACS
    • Mar.
    • T. O. Klaassen, J. H. Blok, J. N. Hovenier, G. Jakob, D. Rosenthal, K. J. Wildeman, Scattering of submillimeter radiation from rough surfaces: absorbers and diffuse reflectors for HIFI and PACS, Proceedings of the SPIE, vol. 4850, pp. 788-796, Mar. 2003
    • (2003) Proceedings of the SPIE , vol.4850 , pp. 788-796
    • Klaassen, T.O.1    Blok, J.H.2    Hovenier, J.N.3    Jakob, G.4    Rosenthal, D.5    Wildeman, K.J.6
  • 3
    • 0030407961 scopus 로고    scopus 로고
    • Miscellaneous data on materials for millimetre and submillimetre optics
    • Dec.
    • J. W. Lamb, Miscellaneous Data on Materials for Millimetre and Submillimetre Optics. International Journal of Infrared and Millimeter Waves, vol. 17, no. 12, pp. 1997-2034, Dec. 1996.
    • (1996) International Journal of Infrared and Millimeter Waves , vol.17 , Issue.12 , pp. 1997-2034
    • Lamb, J.W.1
  • 4
    • 16244419627 scopus 로고    scopus 로고
    • Design of artificial dielectrics for anti-reflection-coatings
    • Munich, Germany, October
    • S.Biber, J. Richter, S. Martins, L.-P. Schmidt, Design of Artificial Dielectrics for Anti-Reflection-Coatings, European Microwave Week, Munich, Germany, October 2003
    • (2003) European Microwave Week
    • Biber, S.1    Richter, J.2    Martins, S.3    Schmidt, L.-P.4
  • 5
    • 0346009277 scopus 로고    scopus 로고
    • Fundamental and second-order phonon processes in CdTe and ZnTe
    • M. Schall, M. Walther, P. U. Jepsen, Fundamental and second-order phonon processes in CdTe and ZnTe, Phys. Rev. B64 (9) 094301, 2001
    • (2001) Phys. Rev. , vol.B64 , Issue.9 , pp. 094301
    • Schall, M.1    Walther, M.2    Jepsen, P.U.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.