Structural trends and chemical bonding in Te-doped silicon clathrates

Inorganic Chemistry

Volumn 44, Issue 7, 2005, Pages 2210-2214

  Jaussaud, Nicolas ^a   Pouchard, Michel ^a   Gravereau, Pierre ^a   Pechev, Stanislas ^a   Goglio, Graziella ^a   Cros, Christian ^a   San Miguel, Alfonso ^b   Toulemonde, Pierre ^b  

^a INST CHIM MATIERE COND BORDEAUX   (France)

^b UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DERIVATIVE; TELLURIUM; TELLURIUM DERIVATIVE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL BINDING; CHEMICAL BOND; CHEMICAL INTERACTION; CHEMICAL STRUCTURE; ELECTRIC POTENTIAL; ELECTRICITY; ENERGY CONSERVATION; HIGH TEMPERATURE; LOW TEMPERATURE; PRESSURE; STRUCTURE ANALYSIS; SYNTHESIS;

EID: 16244408311     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic040112h     Document Type: Article

References (22)

1. Tritt, T. M. Science 1999, 283, 804.
2. Slack, G. New Materials and Performance Limits for Thermoelectric Cooling. In CRC Handbook of Thermoelectrics; Rowe, D. M., Ed.; CRC Press: Boca Raton, FL, 1995; pp 407-440.
3. Iversen, B. B.; Anders, A. E. C.; Cox, D. C.; Nolas, G. S.; Stucky, G. S.; Blake, N. P.; Metiu, H. J. Solid State Chem. 2000, 149, 455.
4. Nolas, G. S.; Cohn, J. L.; Slack, G. A.; Schujman, S. B. Appl. Phys. Lett. 1998, 73, 178.
5. Kasper, J. S.; Hagenmuller, P.; Pouchard, M.; Cros, C. Science 1965, 150, 1713.
6. Cros, C.; Pouchard, M.; Hagenmuller, P. J. Solid State Chem. 1970, 2, 570.
7. Nolas, G. S.; Beckman, M.; Gryko, J.; Lamberton, G. A., Jr.; Tritt, T. M.; McMillan, P. F. Appl. Phys. Lett. 2003, 82, 910.
8. Yamanaka, S.; Enishi, E.; Fukuoka, H.; Yasukawa, M. Inorg. Chem. 2000, 39, 56.
9. Nesper, R.; Curda, J.; von Schnering, H. G. Angew. Chem. 1986, 98, 369.
10. Reny, E.; Yamanaka, S.; Cros, C.; Pouchard, M. Chem. Commun. 2000, 2505.
11. Reny, E.; Yamanaka, S.; Cros, C.; Pouchard, M. J. Phys.: Condens. Matter 2002, 14, 11233.
12. Jaussaud, N.; Pouchard, M.; Goglio, G.; Cros, C.; Ammar, A.; Weill, R; Gravereau, P. Solid State Sci. 2003, 5, 1193.
13. Jaussaud, N.; Toulemonde, P.; Pouchard, M.; San Miguel, A.; Gravereau, P.; Pechev, P.; Goglio, G.; Cros, C. Solid State Sci. 2004, 6, 401.
14. Wiebcke, W.; Mootz, D. Z. Kristallogr. 1986, 177, 291.
15. Wyckoff, R. W. G. In Crystal Structures, Vol. 4; Interscience Publishers: New York, 1968; pp 430-432.
16. Pyykko, P.; Laaksonen, L. J. Phys. Chem. 1984, 88, 4892.
17. Menke, H.; von Schnering, H. G. Z. Anorg. Allg. Chem. 1973, 295, 223.
18. Brinknan, C.; Eisenmann, B.; Schäfer, H. Z Anorg. Allg. Chem. 1985, 524, 83.
19. Plog, K.; Stetter, W.; Novitski, A.; Schönherr, E. Mater. Res. Bull. 1976, 11, 1147.
20. Even, M.; Monconduit, M.; Van der Lee, A.; Brec, R.; Canadell, E.; Rouxel, J. New J. Chem. 1994, 18, 215.
21. Jobic, S.; Brec, R.; Rouxel, J. J. Solid State Chem. 1992, 96, 169.
22. Böttcher, P. Angew. Chem., Int. Ed. Engl. 1988, 27, 759.