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Volumn , Issue , 2004, Pages 274-279

Managing standby and active mode leakage power in deep sub-micron design

Author keywords

Battery lifetime; Drowsy mode; MTCMOS; SRAM leakage control; TGSRAM; Thick gate shadow latch; Transistor leakage

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC BATTERIES; HAND HELD COMPUTERS; INTEGRATED CIRCUIT LAYOUT; MOSFET DEVICES; STANDBY POWER SYSTEMS; STATIC RANDOM ACCESS STORAGE;

EID: 16244390532     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1013235.1013239     Document Type: Conference Paper
Times cited : (12)

References (16)
  • 1
    • 0000793139 scopus 로고
    • Cramming more components onto integrated circuits
    • G. Moore, Cramming more components onto integrated circuits, Electronics, 38, April, 1965, pp. 35-39.
    • (1965) Electronics , vol.38 , Issue.APRIL , pp. 35-39
    • Moore, G.1
  • 2
    • 33646900503 scopus 로고    scopus 로고
    • Device scaling limits of Si MOSFET's and their application dependencies
    • D. Frank et al., Device scaling limits of Si MOSFET's and their application dependencies, Proc. IEEE, 89, March, 2001, pp. 259-288.
    • (2001) Proc. IEEE , vol.89 , Issue.MARCH , pp. 259-288
    • Frank, D.1
  • 3
    • 0034315851 scopus 로고    scopus 로고
    • A dynamic voltage scaled microprocessor system
    • T. Burd, T. Pering, A. Stratakos, and R. Broderson, "A dynamic voltage scaled microprocessor system," IEEE JSSC, vol. 35, Nov., 2000, pp. 1571-1580.
    • (2000) IEEE JSSC , vol.35 , Issue.NOV. , pp. 1571-1580
    • Burd, T.1    Pering, T.2    Stratakos, A.3    Broderson, R.4
  • 4
    • 0031212817 scopus 로고    scopus 로고
    • Supply and threshold voltage scaling for low power CMOS
    • R. Gonzalez, B. Gordon, M. Horowitz, Supply and threshold voltage scaling for low power CMOS, IEEE JSSC, 32, Aug., 1997, pp. 1210-1216.
    • (1997) IEEE JSSC , vol.32 , Issue.AUG. , pp. 1210-1216
    • Gonzalez, R.1    Gordon, B.2    Horowitz, M.3
  • 6
    • 0035308547 scopus 로고    scopus 로고
    • The impact of intrinsic device fluctuations on CMOS SRAM cell stability
    • A. Bhavnagarwala, T. Xinghai, J. Meindl, The impact of intrinsic device fluctuations on CMOS SRAM cell stability, IEEE JSSC, 36, no. 4, 2001, pp. 658-665.
    • (2001) IEEE JSSC , vol.36 , Issue.4 , pp. 658-665
    • Bhavnagarwala, A.1    Xinghai, T.2    Meindl, J.3
  • 7
    • 0033221245 scopus 로고    scopus 로고
    • An 18-μA standby current 1.8-V, 200-MHz microprocessor with self-substrate-biased data-retention mode
    • H. Mizuno, et al., An 18-μA standby current 1.8-V, 200-MHz microprocessor with self-substrate-biased data-retention mode, IEEE JSSC, 34, Nov., 1999, pp. 1492-1500.
    • (1999) IEEE JSSC , vol.34 , Issue.NOV. , pp. 1492-1500
    • Mizuno, H.1
  • 8
    • 0036949550 scopus 로고    scopus 로고
    • Standby power management for a 0.18 □m microprocessor
    • L. Clark, N. Deutscher, F. Ricci, and S. Demmons, Standby power management for a 0.18 □m microprocessor, Proc. ISLPED, 2002, pp. 7-12.
    • (2002) Proc. ISLPED , pp. 7-12
    • Clark, L.1    Deutscher, N.2    Ricci, F.3    Demmons, S.4
  • 9
    • 0242509350 scopus 로고    scopus 로고
    • Microarchitecture uses a low power core
    • M. Morrow, Microarchitecture uses a low power core, IEEE Computer, April, 2001, p. 55.
    • (2001) IEEE Computer , Issue.APRIL , pp. 55
    • Morrow, M.1
  • 10
    • 0029359285 scopus 로고
    • 1V power supply high-speed digital circuit technology with multithreshold-voltage CMOS
    • S. Mutoh, et al., 1V power supply high-speed digital circuit technology with multithreshold-voltage CMOS, IEEE JSSC, 30, Aug., 1995, pp.847-854.
    • (1995) IEEE JSSC , vol.30 , Issue.AUG. , pp. 847-854
    • Mutoh, S.1
  • 11
    • 0031162017 scopus 로고    scopus 로고
    • A 1-V high-speed MTCMOS circuit scheme for power-down application circuits
    • S. Shigematsu, et al., A 1-V high-speed MTCMOS circuit scheme for power-down application circuits, IEEE JSSC, 32, June, 1997, pp. 861-870.
    • (1997) IEEE JSSC , vol.32 , Issue.JUNE , pp. 861-870
    • Shigematsu, S.1
  • 12
    • 0036958067 scopus 로고    scopus 로고
    • Low power integrated scan-retention mechanism
    • V. Zyuban and S. Kosonocky, Low power integrated scan-retention mechanism, Proc. ISLPED, 2002, pp. 98-102.
    • (2002) Proc. ISLPED , pp. 98-102
    • Zyuban, V.1    Kosonocky, S.2
  • 13
    • 4544335291 scopus 로고    scopus 로고
    • Reverse body bias and supply collapse for low effective standby power
    • to appear in
    • L. Clark, M. Morrow, and W. Brown, Reverse Body Bias and Supply Collapse for Low Effective Standby Power, to appear in IEEE Trans. VLSI, July, 2004.
    • (2004) IEEE Trans. VLSI , Issue.JULY
    • Clark, L.1    Morrow, M.2    Brown, W.3
  • 14
    • 4544356232 scopus 로고    scopus 로고
    • Characterization and debug of reverse body bias low power modes
    • L. Clark, D. McCarroll, and E. Bawolek, Characterization and debug of reverse body bias low power modes, Electronic Device Failure Analysis, 6, Feb., 2004, pp. 13-21.
    • (2004) Electronic Device Failure Analysis , vol.6 , Issue.FEB. , pp. 13-21
    • Clark, L.1    McCarroll, D.2    Bawolek, E.3
  • 15
    • 0036294454 scopus 로고    scopus 로고
    • Drowsy caches: Simple techniques for reducing leakage power
    • K. Flautner, et al., Drowsy caches: Simple techniques for reducing leakage power, Proc. ISCA '02, p. 148, 2002.
    • (2002) Proc. ISCA '02 , pp. 148
    • Flautner, K.1
  • 16
    • 0030121481 scopus 로고    scopus 로고
    • Driving source-line cell architecture for low-V high-speed low-power applications
    • H. Mizuno and T. Nagano, Driving source-line cell architecture for low-V high-speed low-power applications, IEEE JSSC, 31, April, 1996, pp. 552-558.
    • (1996) IEEE JSSC , vol.31 , Issue.APRIL , pp. 552-558
    • Mizuno, H.1    Nagano, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.