Specification-based testing with linear temporal logic

Proceedings of the 2004 IEEE International Conference on Information Reuse and Integration, IRI-2004

Volumn , Issue , 2004, Pages 493-498

  Tan, Li ^a   Sokolsky, Oleg ^a   Lee, Insup ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCIDENT PREVENTION; ALGORITHMS; INFORMATION ANALYSIS; MATHEMATICAL MODELS; PROBLEM SOLVING; RELIABILITY;

AUTOMATIC VERIFICATION; LINEAR TEMPORAL LOGIC (LTL); PROPERTY COVERAGE; SPECIFICATION TESTING;

TESTING;

EID: 16244371051     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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