Plannable test selection criteria for FSMs extracted from operational specifications

Proceedings - International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 2004, Pages 173-184

  Paradkar, Amit ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

EFSM based Test Selection; Model Based Test Generation; Mutation based Test Selection

Indexed keywords

EFSM-BASED TEST SELECTION; MODEL-BASED TEST GENERATION; MUTATION-BASED TEST SELECTION; SYSTEM UNDER TEST (SUT);

ALGORITHMS; ERROR ANALYSIS; GRAPHICAL USER INTERFACES; MATHEMATICAL MODELS; MATHEMATICAL OPERATORS; PARAMETER ESTIMATION;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 16244364817     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSRE.2004.28     Document Type: Conference Paper

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