Advances in probe development and calibration procedure enhance material measurements

Conference Digest of the 2004 Joint 29th International Conference on Infrared and Millimeter Waves and 12th International Conference on Terahertz Electronics

Volumn , Issue , 2004, Pages 215-216

  Huynh, J ^a   Augustin, D ^b  

^a Agilent Technologies Netherlands BV   (Netherlands)

^b AGILENT TECHNOLOGIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER SOFTWARE; GENETIC ALGORITHMS; MATERIALS TESTING; MATHEMATICAL MODELS; MEASUREMENT ERRORS; MEASUREMENT THEORY; PERMITTIVITY;

COAXIAL PROBE TECHNIQUES; FRINGE CAPACITANCE; MATERIAL MEASUREMENTS; MATERIAL UNDER TEST (MUT);

PROBES;

EID: 16244363363     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. Philip G. Hartley, Jr., Stuart O. Nelson, Ronald W. McClendon and Walter D. Potter, "Modeling Permittivity Measurement Probes by Using a Genetic Algorithm", IMTC 2004 - Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May 2004.