Data analysis in the optical PoSAP

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 457-463

  Cerezo, A ^a   Hyde, J M ^a,b   Sijbrandij, S J ^a   Smith, G D W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b RICARDO UK LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANODES; ATOMS; CALCULATIONS; CAMERAS; DATA REDUCTION; DETECTORS; IMAGING TECHNIQUES; IONS; OPTICAL CORRELATION; PROBES;

CHARGE CENTROIDING; CORRESPONDENCE MAP; FLIGHT TIMES; MULTIPLE ION EVENTS; POSITION SENSITIVE ATOM PROBE;

OPTICAL INSTRUMENTS;

EID: 16144369214     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00410-6     Document Type: Article

References (6)

1. A. Cerezo, T.J. Godfrey and G.D.W. Smith, Rev. Sci. Instr. 59 (1988) 862.
2. D. Blavette, B. Deconihout, A. Bostel, J.M. Sarrau, M. Bouet and A. Menand, Rev. Sci. Instr. 64 (1993) 2911.
3. A. Cerezo, T.J. Godfrey, J.M. Hyde, S.J. Sijbrandij and G.D.W. Smith. Appl. Surf. Sci. 76/77 (1994) 374.
4. M.K. Miller, Surf. Sci. 266 (1991) 494.
5. A.S. Cooper, A. Cerezo, J.M. Hyde, R.A.D. Mackenzie and G.D.W. Smith, Appl. Surf. Sci. 76/77 (1994) 409.
6. S.J. Sijbrandij, A. Cerezo, T.J. Godfrey and G.D.W. Smith, Appl. Surf. Sci. 94/95 (1996) 428.