High contrast imaging of interphases in ternary polymer blends using focused ion beam preparation and atomic force microscopy

Macromolecules

Volumn 38, Issue 6, 2005, Pages 2368-2375

  Virgilio, Nick ^a   Favis, Basil D ^a   Pépin, Marie France ^a   Desjardins, Patrick ^a   L'Espérance, Gilles ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; DEFORMATION; ETCHING; ION BEAMS; MATHEMATICAL MODELS; MIXING; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SOLVENTS;

DIMENSIONS; HIGH CONTRAST IMAGING; INTERFACIAL DEBONDING; INTERPHASES;

POLYMER BLENDS;

EID: 15944394086     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma0482664     Document Type: Article

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