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Volumn 244, Issue 1-4, 2005, Pages 359-364

HRTEM observation of interface states between ZnO epitaxial film and Si(1 1 1) substrate

Author keywords

Annealing; Epitaxial growth; Exciton; Interface state; Photoluminescence; Si; Thin film; ZnO; ZnS

Indexed keywords

ANNEALING; DEPOSITION; ELECTRON BEAMS; EPITAXIAL GROWTH; EVAPORATION; EXCITONS; OXIDATION; PHOTOLUMINESCENCE; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EXCITON EMISSION; INTERFACE STATES; SILICON SUBSTRATES; ZNS;

THIN FILMS;

EID: 15844429773 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2004.10.091 Document Type: Conference Paper

Times cited : (10)

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