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Nanotechnology

Volumn 16, Issue 3, 2005, Pages

Electrostatic force spectroscopy of near surface localized states

(2) Dâna, Aykutlu a Yamamoto, Yoshihisa b

a BILKENT UNIVERSITY (Turkey)

b STANFORD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; FERMI LEVEL; FREQUENCY SHIFT KEYING; INDIUM COMPOUNDS; LOW TEMPERATURE PHENOMENA; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPIC ANALYSIS; SURFACES;

BIAS VOLTAGES; ELECTRONIC CHARGES; ELECTROSTATIC FORCE MICROSCOPY; LOCALIZED STATES;

ELECTROSTATICS;

EID: 15844426937 PISSN: 09574484 EISSN: None Source Type: Journal
DOI: 10.1088/0957-4484/16/3/023 Document Type: Conference Paper

Times cited : (16)

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