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Volumn 752, Issue 1-4 SPEC. ISS., 2005, Pages 706-715

Nuclear processes and soft fails in microelectronics

Author keywords

[No Author keywords available]

Indexed keywords


EID: 15844426522     PISSN: 03759474     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nuclphysa.2005.02.070     Document Type: Article
Times cited : (8)

References (29)
  • 1
    • 15844412739 scopus 로고    scopus 로고
    • A special issue on terrestrial cosmic rays and soft errors
    • IBM J. Res. Dev. 40 1 1996 A special issue on terrestrial cosmic rays and soft errors
    • (1996) IBM J. Res. Dev. , vol.40 , Issue.1
  • 2
    • 0037291061 scopus 로고    scopus 로고
    • A special issue on Single-Event Upsets in Microelectronics
    • H.H.K. Tang N. Olsson Mat. Res. Soc. Bulletin 28 2003 107-140 A special issue on Single-Event Upsets in Microelectronics
    • (2003) Mat. Res. Soc. Bulletin , vol.28 , pp. 107-140
    • Tang, H.H.K.1    Olsson, N.2
  • 12
    • 15844413122 scopus 로고    scopus 로고
    • UC Davis (private communication)
    • J.L. Romero, UC Davis (private communication)
    • Romero, J.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.