Nanocrystalline WO 3 films prepared by two-step annealing

Applied Surface Science

Volumn 244, Issue 1-4, 2005, Pages 453-457

  Jayatissa, Ahalapitiya H ^a   Dadi, Anantharamprasad ^a   Aoki, Toru ^b  

^a UNIVERSITY OF TOLEDO   (United States)

^b SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Annealing; Nanocrystalline; Raman spectroscopy; Thin films; Tungsten oxide

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; CRYSTAL STRUCTURE; FILM PREPARATION; HIGH TEMPERATURE EFFECTS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS LIKE-STRUCTURE; NANOCRYSTALLINE FILMS; ROOM TEMPERATURE; TUNGSTEN OXIDE;

THIN FILMS;

EID: 15844419781     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.10.101     Document Type: Conference Paper

References (4)

1. 3 )/pin structure for room temperature operation Solid-State Electron. 47 2003 827 830
2. M. Fleischer, and H. Meixner Fast gas sensors based on metal oxides which are stable at high temperatures Sensors Actuat. B: Chem. 43 1997 1 10
3. B. Ziemer, and H.J. Lunkquadif A simple program for quantitative X-ray powder diffraction analysis of tungsten oxide and other systems with low crystallinity Int. J. Refractory Met. Hard Mater. 14 1996 279 287
4. 3 tungsten oxide J. Phys.: Condensed Matter 14 2002 5849 5863