A family of langasite: Growth and structure

Journal of Crystal Growth

Volumn 275, Issue 1-2, 2005, Pages

  Kuzmicheva, G M ^a   Domoroschina, E N ^a,b   Rybakov, V B ^c   Dubovsky, A B ^b   Tyunina, E A ^a  

^a MIREA RUSSIAN TECHNOLOGICAL UNIVERSITY   (Russian Federation)

^b Russ Res Inst Synthesis Minerals   (Russian Federation)

^c MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

A1. Characterization; A2. Czochralski method; B1. Oxides; B2. Piezoelectric materials; B3. Filters

Indexed keywords

CHARACTERIZATION; COMPOSITION; CRYSTAL STRUCTURE; HEAT TREATMENT; LANTHANUM COMPOUNDS; OXYGEN; PIEZOELECTRIC MATERIALS; SOLID SOLUTIONS; X RAY DIFFRACTION ANALYSIS;

ANISOTROPIC TEMPERATURE FACTORS; CZOCHRALSKI METHOD; FILTERS; LANGASITE; POLARITY;

CRYSTAL GROWTH FROM MELT;

EID: 15844404698     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.062     Document Type: Conference Paper

References (2)

1. E.L. Belokoneva Inorg. Chem. 45 11 2000 1786 (in Russian)
2. G.M. Kuz'micheva Inorg. Mater. 38 10 2002 1 (in Russian)