A statistical investigation of dielectric breakdown of low-density polyethylene

Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004

Volumn 1, Issue , 2004, Pages 83-86

  Sekii, Yasuo ^a   Kazama, Tatsuya ^a  

^a CHIBA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; LOW DENSITY POLYETHYLENES; NATURAL FREQUENCIES; PLASTIC FILMS; STRESS ANALYSIS; WEIBULL DISTRIBUTION;

BREAKDOWN STRENGTH (BDS); DIELECTRIC BREAKDOWN; LOCATION PARAMETERS; WEIBULL PROBABILITY;

ELECTRIC BREAKDOWN;

EID: 15844402344     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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2. L.A. Dissado and J.C. Fothergill, "Electrical Degradation and Breakdown in Polymers," Chap. 14 Statistical Features of Breakdown, Stevenage, U.K., Peter Peregrinus, Ltd. (1991)
3. L.A. Dissado, J.C. Fothergill, S.V. Wolfe, and R.M. Hill, "Weibull Statistics in Dielectric Breakdown, Theoretical Basis, Applications and Implications," IEEE Trans. on Electrical Insulation, Vol. EI-19, No. 3, pp. 227-233, 1984.
4. C. Chauvet and C. Laurent, "Weibull Statistics in Short-term Dielectric Breakdown of Thin Polyethylene Film," IEEE Trans. on Electrical Insulation, Vol. 28, No. 1 pp. 18-29, 1993.
5. Y. Sekii, K. Asakawa, and K. Mouri, "Statistical In vestigation of Dielectric Breakdown of LDPE," Proc. of ISEIM, pp. 562-565, 2001.
6. B. Epstein and H. Brooks, "The Theory of Extreme Values and Its implication in the Study of the Dielectric Strength of Paper Capacitors," J. Appl. Phys., Vol. 19, pp. 544-550, 1948.