Electron beam and laser testing on the novel stripixel detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 541, Issue 1-2, 2005, Pages 21-28

  Li, Z ^a,b   En'Yo, H ^a,c   Eremin, V ^d   Goto, Y ^a,c   Li, C J ^e   Taketani, A ^c   Tojo, J ^c  

^a RIKEN BNL RESEARCH CENTER   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c RIKEN   (Japan)

^d IOFFE INSTITUTE   (Russian Federation)

^e INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

Alternating pixels; EBIC; Interleaved pixels; Stripixel detector

Indexed keywords

DIFFUSION; ELECTRIC POTENTIAL; ELECTRON BEAMS; LASER BEAMS; LASER PULSES; READOUT SYSTEMS; SCANNING;

ALTERNATING PIXELS; EBIC; INTERLEAVED PIXELS; STRIPIXEL DETECTORS;

SILICON SENSORS;

EID: 15844388734     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.01.034     Document Type: Conference Paper

References (4)

1. Z. Li, BNL Internal Report, BNL #67527, June 10, 2000.
2. Z. Li Nucl. Instr. and Meth. A 518 3 2004 738
3. Z. Li Novel silicon stripixel detector for PHENIX Upgrade, Presented on Ninth Pisa Meeting on Advance Detectors, May 25-31, La Biodola, Isola d'Elba, Italy Nucl. Instr. and Meth. A 518 2004 300
4. J. Tojo, et al., Development of a novel silicon stripixel detector for RHIC-PHENIX Detector Upgrade, Presented on IEEE Nuclear Science Symposium, October 19-25, 2003, Portland, Oregon, IEEE Trans. Nucl. Sci., Vol. 51, No. 5, October (2004) 2337.