The secondary structure control of silk fibroin thin films by post treatment

Applied Surface Science

Volumn 244, Issue 1-4, 2005, Pages 623-626

  Taketani, I ^a   Nakayama, S ^a   Nagare, S ^b   Senna, M ^a  

^a KEIO UNIVERSITY   (Japan)

^b Nara Machinery Co Ltd   (Japan)

Author keywords

Post treatment; Secondary structure; Silk fibroin (SF); sheet

Indexed keywords

ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN BONDS; MORPHOLOGY; POLYETHYLENES; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILK;

POST TREATMENT; SECONDARY STRUCTURE; SILK FIBROINS (SF); Β-SHEET STRUCTURE;

THIN FILMS;

DEPOSITION; FOURIER ANALYSIS; INFRARED SPECTROSCOPY; LASERS; POLYETHYLENE; SCANNING ELECTRON MICROSCOPY; SILK; THIN FILMS;

EID: 15844386419     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.167     Document Type: Conference Paper

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