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Volumn 127, Issue 1, 2005, Pages 90-96

A study of creep in polysilicon MEMS devices

Author keywords

Creep Measurements; High Temperature Plastic Deformation; Polysilicon Material Properties

Indexed keywords

CREEP; MATHEMATICAL MODELS; MELTING; PLASTIC DEFORMATION; POLYSILICON; STRESS ANALYSIS; THERMAL EFFECTS; THIN FILMS;

EID: 15844379906     PISSN: 00944289     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1839214     Document Type: Conference Paper
Times cited : (52)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.