Thin organic heterostructures deposited via organic vapor phase deposition: Spectroscopic ellipsometry characterization

Journal of Crystal Growth

Volumn 275, Issue 1-2, 2005, Pages

  Himcinschi, C ^a   Hartmann, S ^b   Janssen, A ^b   Meyer, N ^c   Friedrich, M ^a   Kowalsky, W ^b   Zahn, D R T ^a   Heuken, M ^c  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^c AIXTRON AG   (Germany)

Author keywords

A3. Organic vapor phase deposition; B2. Organic semiconducting materials; B3. Light emitting diodes

Indexed keywords

ALUMINUM COMPOUNDS; COMPUTER SIMULATION; DATA REDUCTION; ELLIPSOMETRY; LIGHT EMITTING DIODES; POLARIMETERS; SEMICONDUCTING ORGANIC COMPOUNDS; SILICON; SPECTROSCOPIC ANALYSIS; THERMOANALYSIS;

ORGANIC SEMICONDUCTING MATERIALS; ORGANIC VAPOR PHASE DEPOSITION (OVPD); VACUUM THERMAL EVAPORATION (VTE); VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE);

HETEROJUNCTIONS;

EID: 15844379148     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.127     Document Type: Conference Paper

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