Noise performance comparison of ICCD with CCD and EMCCD cameras

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5563, Issue , 2004, Pages 195-204

  Dussault, David ^a   Hoess, Paul ^b  

^a Paul Hoess KG ^*  (Germany)

^b Stanford Computer Optics Inc   (United States)

Author keywords

CCD; Charge Transfer Efficiency; Clocking Induced Charge; Dark current; EMCCD; ICCD; Readout noise; Shot noise; SNR

Indexed keywords

CHARGE TRANSFER EFFICIENCY; CLOCKING INDUCED CHARGE; DARK CURRENTS; EMCCD; ICCD; READOUT NOISE;

CAMERAS; CHARGE TRANSFER; ELECTRIC POTENTIAL; IMAGE QUALITY; IMAGING TECHNIQUES; LENSES; PHOTOCATHODES; SHOT NOISE; SIGNAL TO NOISE RATIO;

CHARGE COUPLED DEVICES;

EID: 15844372979     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.561839     Document Type: Conference Paper

References (6)

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6. "CCD97-00 Back Illuminated 2-Phase IMO Series, Electron Multiplying CCD Sensor", November 2003, e2v technologies limited, Waterhouse Lane, Chelmsford, England.