메뉴 건너뛰기




Volumn 541, Issue 1-2, 2005, Pages 172-177

Development of monolithic active pixel detector in SOI technology

Author keywords

Active pixel detector; Silicon detector; SOI technology

Indexed keywords

BONDING; HIGH ENERGY PHYSICS; IONIZING RADIATION; READOUT SYSTEMS; SILICON SENSORS; SILICON WAFERS;

EID: 15844368289     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.01.054     Document Type: Conference Paper
Times cited : (16)

References (8)
  • 4
    • 3142775363 scopus 로고    scopus 로고
    • TSSOI as an Efficient Tool for Diagnostics of SOI Technology in the IET
    • Warsaw, Poland
    • M. Baranski, et al., TSSOI as an Efficient Tool for Diagnostics of SOI Technology in the IET, Proceedings on Diagnostics & Yield 2003, Warsaw, Poland, 2003.
    • (2003) Proceedings on Diagnostics & Yield 2003
    • Baranski, M.1
  • 5
    • 15844403196 scopus 로고    scopus 로고
    • Technology development for silicon monolithic pixel sensor in SOI technology
    • Lodz
    • H. Niemiec, et al., Technology development for silicon monolithic pixel sensor in SOI technology, Proceedings of the Tenth International Conference MIXDES 2003, Lodz, 2003, pp. 508-511.
    • (2003) Proceedings of the Tenth International Conference MIXDES 2003 , pp. 508-511
    • Niemiec, H.1
  • 8
    • 33645263004 scopus 로고    scopus 로고
    • Shutter operations for CCD and CMOS image sensors
    • Eastman Kodak Company, Shutter operations for CCD and CMOS image sensors, Application Notes, 2001. Available at http://www.kodak.com/global/plugins/ acrobat/en/digital/ccd/applicationNotes/ShutterOperations.pdf.
    • (2001) Application Notes


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.