Research on light scattering characteristics of rough surface and optical constants deduction

Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering

Volumn 33, Issue 5, 2004, Pages 549-552

  Wang, Ming Jun ^a,b   Dong, Yan Bing ^b   Wu, Zhen Sen ^a   Deng, Rong ^b   Wang, Yun Qiang ^b  

^a XIDIAN UNIVERSITY   (China)

^b Environments Key Laboratory   (China)

Author keywords

BRDF; Equivalent optical constant; Hemisphere reflectivity spectrum; Rough surface

Indexed keywords

BRDF; EQUIVALENT OPTICAL CONSTANTS; HEMISPHERE REFLECTIVITY SPECTRA; ROUGH SURFACES;

ALUMINUM COMPOUNDS; ELLIPSOMETRY; LIGHT REFLECTION; MATHEMATICAL MODELS; OPTIMIZATION; SILICON COMPOUNDS; STATISTICAL METHODS; SURFACE ROUGHNESS; SURFACES;

LIGHT SCATTERING;

EID: 15844363437     PISSN: 10072276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

1. Wu Zhensen. IR laser backscattering by arbitrarily shaped dielectric object with rough face[J]. Journal of Electronics, 1993, 10(4): 298-306.
2. Tomiyaasu K. Relationship between and measurement of diffraction scattering coefficient and bi-directional reflectance distribution function (BRDF)[J]. IEEE, 1998, GE-26(5): 660-665.
3. Ulaby F T, Moore R K, Fung A K. Microwave remote sensing, Vol. 2[M]. Massachusetts: Addison-Wesley publishing company, 1982, 922-991.
4. Wu Zhensen, Xie Donghui, Wei Qinlong, et al. Modeling reflectance function from rough surface and algorithm[J]. Acta Optica Sinica, 2002, 22(8): 897-901.
5. Vorburger T V, Ludema K C. Ellipsometry of rough surfaces [J]. Applied Optics, 1980, 19(4): 561-573.