Electroplating of Ni4W

Electrochemical and Solid-State Letters

Volumn 8, Issue 3, 2005, Pages

  Sridhar, T M ^a   Eliaz, N ^a   Gileadi, E ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CATHODES; CRYSTALLOGRAPHY; CURRENT DENSITY; DIFFRACTOMETERS; ELECTRODES; ENERGY DISPERSIVE SPECTROSCOPY; MORPHOLOGY; NICKEL ALLOYS; PH EFFECTS; SCANNING ELECTRON MICROSCOPY; SOLID STATE DEVICES; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS STRUCTURE; CRYSTALLOGRAPHIC STRUCTURE; FARADAIC EFFICIENCY (FE); SYNERGISTIC EFFECTS;

ELECTROPLATING;

EID: 15744402285     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1857114     Document Type: Article

References (9)

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