SCOPUS 정보 검색 플랫폼

Volumn 45, Issue 3-4, 2005, Pages 739-751

Measuring process capability based on CPK with gauge measurement errors

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; GAGES; MANUFACTURE; PROBABILITY; PROBABILITY DENSITY FUNCTION;

GAUGE MEASUREMENT ERRORS; MANUFACTURING INDUSTRY; PROCESS CAPABILITY INDICES; PROCESS REPRODUCTION CAPABILITY;

PROCESS ENGINEERING;

EID: 15744392239 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/j.microrel.2004.09.005 Document Type: Article

Times cited : (41)

References (14)

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2
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- Mittag, H.J.¹

6
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- Gauge capability and designed experiments. Part I: Basic methods
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- Montgomery, D.C.¹ Runger, G.C.²

7
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