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Volumn 71, Issue 4, 2005, Pages

Theoretical study on first-principles dielectric properties of silicate compounds

Author keywords

[No Author keywords available]

Indexed keywords

HAFNIUM; SILICATE; SILICON DIOXIDE; ZIRCONIUM;

EID: 15744391465     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.045332     Document Type: Article
Times cited : (12)

References (27)
  • 19
    • 0000746166 scopus 로고
    • Interscience Publishers, New York
    • R. W. G. Wyckoff, Crystal Structures, 2nd ed. (Interscience Publishers, New York, 1963), Vol. I, pp. 243-246;316-319.
    • (1963) Crystal Structures, 2nd Ed. , vol.1 , pp. 243-246
    • Wyckoff, R.W.G.1
  • 21
    • 0038373417 scopus 로고    scopus 로고
    • edited by S. P. Baker (American Institute of Physics, New York)
    • A. Tachibana, in Stress Incuded Phenomena in Metallization, edited by S. P. Baker (American Institute of Physics, New York, 2002), pp. 105-116.
    • (2002) Stress Incuded Phenomena in Metallization , pp. 105-116
    • Tachibana, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.