A detection method for irregular lightness variation of low contrast

Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics

Volumn 7, Issue , 2004, Pages 6401-6406

  Taniguchi, Kazutaka ^a   Ueta, Kunio ^a   Tatsumi, Shoji ^b  

^a DAINIPPON SCREEN MFG CO LTD   (Japan)

^b Osaka Prefecture University   (Japan)

Author keywords

Contrast enhancement; Defect; Detection; Mura; Spatial frequency; Vision

Indexed keywords

CONTRAST ENHANCEMENT; MURA; SPATIAL FREQUENCY; VISUAL DETECTION;

COLOR VISION; DEFECTS; ERROR DETECTION; HIGH PASS FILTERS; IMAGE ENHANCEMENT; IMAGE QUALITY; LIQUID CRYSTAL DISPLAYS; OPTICAL FILTERS; PHOTORESISTS; SAMPLING; SPURIOUS SIGNAL NOISE; SURFACE ROUGHNESS;

LIGHT MEASUREMENT;

EID: 15744388048     PISSN: 1062922X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSMC.2004.1401406     Document Type: Conference Paper

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