ATM in-situ bending test on deformation behavior of polyethylene lamellar structure

Zairyo/Journal of the Society of Materials Science, Japan

Volumn 53, Issue 12, 2004, Pages 1359-1364

  Yashiro, Kisaragi ^a   Kanai, Masayuki ^a   Tomita, Yoshihiro ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; In situ bending test; Lamella; Polyethylene; Polymer

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; IMAGE PROCESSING; POLYMERS; ROTATION; SCANNING; TIME SERIES ANALYSIS;

IN-SITU BENDING TESTS; LAMELLA; ROTATION ANGLE; TIME SEQUENCE;

POLYETHYLENES;

EID: 15744386163     PISSN: 05145163     EISSN: None     Source Type: Journal    
DOI: 10.2472/jsms.53.1359     Document Type: Article

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