On the dynamics of metallic particle contaminants in compressed gas insulated systems with dielectric-coated electrodes

IEEE Power Engineering Review

Volumn 19, Issue 3, 1999, Pages 70-71

  Morcos, M M ^a,c   Zhang, S ^a,b   Srivastava, K D ^b,c   Gubanski, S ^a,b,c  

^a KANSAS STATE UNIVERSITY   (United States)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^c CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

Compressed gas insulated systems; Dielectric coated electrodes; Particle movement

Indexed keywords

EID: 15744380618     PISSN: 02721724     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)

1. K.S. Prakash, K.D. Srivastava, M.M. Morcos, "Movement of Particles in Compressed SF6 GIS with Dielectric Coated Enclosure," IEEE Transactions on Dielectrics and Electrical Insulation, 1997, Volume 4, Number 3, pages 344-347.
2. H. Anis, K.D. Srivastava, "Breakdown Characteristics of Dielectric Coated Electrodes in Sulfur Hexafluoride Gas with Particle Contamination," Proceedings of the Sixth International Symposium on High Voltage Engineering, 1981, Paper No. 32.06, pages 327-338.
3. M. Holmberg, "Motion of Metallic Particles in Gas Insulated Systems," Technical Report No. 312, Chalmers University of Technology, Gothenburg, Sweden, 1997.