PLS-based optimal quality control model for TE process

Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics

Volumn 2, Issue , 2004, Pages 1354-1359

  Kai, Song ^a   Hai qing, Wang ^a   Ping, Li ^a  

^a STATE KEY LABORATORY OF INDUSTRIAL CONTROL TECHNOLOGY   (China)

Author keywords

Partial least square (PLS) algorithm; Statistical Quality Control (SQC); Tennessee Eastman Process (TEP)

Indexed keywords

MANAGEMENT STRATEGIES; PARTIAL LEAST SQUARE (PLS) ALGORITHM; STATISTICAL QUALITY CONTROL (SQC); TENNESSEE EASTMAN PROCESS (TEP);

ALGORITHMS; COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; STATISTICAL PROCESS CONTROL;

QUALITY CONTROL;

EID: 15744378899     PISSN: 1062922X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. M. Wise Barry, Neal B. Gallagher, quot;The process chemometrics approach to process monitoring and fault detectionquot;, Journal of Process Control, Vol 6, No. 6, pp. 329-348, 1996.
2. U. Kruger, Q. Chen, D.J. Sandoz, R.C. McFariane, quot;Extended PLS Approach for Enhanced Condition Monitoring of Industrial Processesquot;, AIChE Journal, Vol 47, No. 9, pp. 2076-2091, 2001.
3. Ricardo Dunia, S. J. Qin, quot;Subspace Approach to Multidimensional Fault Identification and Reconstructionquot;, AIChE Journal, Vol 44, No. 8, pp.1813-1831, 1998.
4. I.N. Wakeling, J.J. Morris, quot;A test of significance for partial least squares regressionquot;, Journal of Chemometrics, No. 7, pp. 291-304, 1993.
5. J. Shao, quot;Linear model selection by cross-validationquot;, Journal of the American statistical Association, Vol 88, pp. 486-494, 1993.
6. J. J. Downs, E. F. Vogel, quot;A plant-wide industrial process control problemquot;, Computers & Chemical Engineering, Vol 17, No. 3, pp. 245-2551993.
7. P. R. Lyman, C. Georgakist, quot;Plant-wide Control of the Tennessee Eastman Problemquot;, Computers & Chemical Engineering, Vol 19, pp.321-3311995.
8. Leo H. Chiang, Richard D. Braatz, Evan Russell, Fault Detection and Diagnosis in Industrial Systems, London New York, Springer, 2001.