메뉴 건너뛰기




Volumn 23, Issue 2, 2005, Pages 510-516

Yield analysis of optical MEMS assembly process using a Monte Carlo simulation technique

Author keywords

2 2 switch; Design for manufacturability; Monte Carlo simulation; Optical microelectromechanical systems (MEMS); Process capability

Indexed keywords

COMPUTER SIMULATION; MICROELECTROMECHANICAL DEVICES; MIRRORS; MONTE CARLO METHODS; OPTICAL DESIGN; STATISTICAL METHODS;

EID: 15744364905     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2004.842301     Document Type: Article
Times cited : (6)

References (12)
  • 1
    • 0031268305 scopus 로고    scopus 로고
    • "Micromachining for and optical optoelectronic systems"
    • Nov
    • M. C. Wu, "Micromachining for and optical optoelectronic systems," Proc. IEEE, vol. 85, no. 11, pp. 1833-1856, Nov. 1997.
    • (1997) Proc. IEEE , vol.85 , Issue.11 , pp. 1833-1856
    • Wu, M.C.1
  • 2
    • 0032762248 scopus 로고    scopus 로고
    • "Micro-opto-mechanical 2 × 2 switch for single-mode fibers based on plasma-etched silicon mirror and electrostatic actuation"
    • Jan
    • C. Marxer and N. F. de Rooij, "Micro-opto-mechanical 2 × 2 switch for single-mode fibers based on plasma-etched silicon mirror and electrostatic actuation," J. Lightwave Technol., vol. 17, no. 1, pp. 2-6, Jan. 1999.
    • (1999) J. Lightwave Technol. , vol.17 , Issue.1 , pp. 2-6
    • Marxer, C.1    Rooij, N.F.2
  • 3
    • 0033732890 scopus 로고    scopus 로고
    • "On the expandability of free-space micromachined optical cross connects"
    • Apr
    • L.-Y. Lin, E. L. Goldstein, and R. W. Tkach, "On the expandability of free-space micromachined optical cross connects," J. Lightwave Technol., vol. 18, no. 4, pp. 482-489, Apr. 2000.
    • (2000) J. Lightwave Technol. , vol.18 , Issue.4 , pp. 482-489
    • Lin, L.-Y.1    Goldstein, E.L.2    Tkach, R.W.3
  • 4
    • 0033080136 scopus 로고    scopus 로고
    • "A variable optical attenuator based on silicon micromechanics"
    • Feb
    • C. Marxer, P. Griss, and N. F. de Rooij, "A variable optical attenuator based on silicon micromechanics," Photon. Technol. Lett., vol. 11, pp. 233-235, Feb. 1999.
    • (1999) Photon. Technol. Lett. , vol.11 , pp. 233-235
    • Marxer, C.1    Griss, P.2    Rooij, N.F.3
  • 5
    • 0032302125 scopus 로고    scopus 로고
    • "Tunable optical filters for dense WDM networks"
    • Dec
    • D. Sadot and E. Boimovich, "Tunable optical filters for dense WDM networks," Commun. Mag., vol. 36, no. 12, pp. 50-55, Dec. 1998.
    • (1998) Commun. Mag. , vol.36 , Issue.12 , pp. 50-55
    • Sadot, D.1    Boimovich, E.2
  • 7
    • 84894000785 scopus 로고
    • "Alignment of Gaussian beams"
    • Dec. 1
    • W. B. Joyce and B. C. DeLoach, "Alignment of Gaussian beams," Appl. Opt., vol. 23, pp. 4187-4196, Dec. 1, 1984.
    • (1984) Appl. Opt. , vol.23 , pp. 4187-4196
    • Joyce, W.B.1    Deloach, B.C.2
  • 8
    • 15744386475 scopus 로고
    • Computational Science Education Project. Introduction to Monte Carlo Methods Copyright (C). [Online]. Available:
    • Computational Science Education Project. Introduction to Monte Carlo Methods Copyright (C) 1991-1995. [Online]. Available: http://csepl.phy. ornl.gov/mc/mc.html
    • (1991)
  • 10
    • 0018105155 scopus 로고
    • "Light propagation in graded index optical fibers"
    • M. D. Feit and J. A. Fleck, "Light propagation in graded index optical fibers," Appl. Opt., vol. 17, no. 24, pp. 3990-3998, 1978.
    • (1978) Appl. Opt. , vol.17 , Issue.24 , pp. 3990-3998
    • Feit, M.D.1    Fleck, J.A.2
  • 11
    • 0001379772 scopus 로고    scopus 로고
    • "Comparison of statistical enhancement methods for Monte Carlo semiconductor simulation"
    • Dec
    • C. J. Wordelman, T. J. T. Kwan, and C. M. Snell, "Comparison of statistical enhancement methods for Monte Carlo semiconductor simulation," Trans. Computer-Aided Design Integr. Circuits Syst., vol. 17, no. 12, pp. 1230-1235, Dec. 1998.
    • (1998) Trans. Computer-Aided Design Integr. Circuits Syst. , vol.17 , Issue.12 , pp. 1230-1235
    • Wordelman, C.J.1    Kwan, T.J.T.2    Snell, C.M.3
  • 12
    • 0033700725 scopus 로고    scopus 로고
    • "A new TCAD-based statistical methodology for the optimization and sensitivity analysis of semiconductor technologies"
    • May
    • S. Williams and K. Varahramyan, "A new TCAD-based statistical methodology for the optimization and sensitivity analysis of semiconductor technologies," Trans. Semicond. Manuf., vol. 13, no. 2, pp. 208-218, May 2000.
    • (2000) Trans. Semicond. Manuf. , vol.13 , Issue.2 , pp. 208-218
    • Williams, S.1    Varahramyan, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.