Synchrotron radiation effects on catalytic systems as probed with a combined in-situ UV-Vis/XAFS spectroscopic setup

Journal of Physical Chemistry B

Volumn 109, Issue 9, 2005, Pages 4042-4047

  Mesu, J Gerbrand ^a   Van Der Eerden, Ad M J ^a   De Groot, Frank M F ^a   Weckhuysen, Bert M ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY MIXTURES; CATALYSIS; COPPER COMPOUNDS; ORGANIC SOLVENTS; OXIDATION; REACTION KINETICS; SALTS; X RAY DIFFRACTION ANALYSIS;

IN-SITU SPECTROSCOPY; REACTION INTERMEDIATES; REACTION MIXTURES; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY (XAFS);

SYNCHROTRON RADIATION;

EID: 15544376776     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp045206r     Document Type: Article

References (28)

1. In-situ Spectroscopy of Catalysts; Weckhuysen, B. M., Ed.; American Scientific Publishers: Stevenson Ranch, 2004.
2. In-situ Spectroscopy in Heterogeneous Catalysis; Haw, J. F., Ed.; Wiley-VCH: Weinheim, 2002.
3. Lamberti, C.; Prestipino, C.; Bonino, F.; Capello, L.; Bordiga, S.; Spoto, G.; Zecchina, A.; Moreno, S. D.; Cremaschi, B.; Garilli, M.; Marsella, A.; Carmello, D.; Vidotto, S.; Leofanti, G. Angew. Chem., Int. Ed. 2002, 41, 2341.
4. Lamberti, C.; Bordiga, S.; Bonino, F.; Prestipino, C.; Berlier, G.; Capello, L.; D'Acapito, F.; Xamena, F. X. L. i.; Zecchina, A. Phys. Chem. Chem. Phys. 2003, 5, 4502.
5. Newton, M. A.; Dent, A. J.; Diaz-Moreno, S.; Fiddy, S. G.; Evans, J. Angew. Chem., Int. Ed. 2002, 41, 2587.
6. Clausen, B. S.; Topsoe, H.; Frahm, R. Adv. Catal. 1998, 42, 315.
7. Sankar, G.; Thomas, J. M.; Catlow, C. R. A. Top. Catal. 2000, 10, 255.
8. Sankar, G.; Thomas, J. M. Top. Catal. 1999, 8, 1.
9. Grunwaldt, J.-D.; Clausen, B. S. Top. Catal. 2002, 18, 37.
10. Tromp, M.; Sietsma, J. R. A.; Bokhoven, J. A. v.; Stijdonck, G. P. A. v.; Haaren, R. J. v.; Eerden, A. M. J. v. d.; Leeuwen, P. W. N. v.; Koningsberger, D. C. Chem. Commun. 2003, 128.
11. Tromp, M. Developments of Time-Resolved XAFS Spectroscopy Techniques; Ph.D. Thesis, Utrecht University, 2004.
12. Nijhuis, T. A.; Tinnemans, S. J.; Visser, T.; Weckhuysen, B. M. Phys. Chem. Chem. Phys. 2003, 5, 4361.
13. Weckhuysen, B. M. Phys. Chem. Chem. Phys. 2003, 5, 4351.
14. Nijhuis, T. A.; Tinnemans, S. J.; Visser, T.; Weckhuysen, B. M. Chem. Eng. Sci. 2004, 59, 5487.
15. Tinnemans, S. J.; Kox, M. H. F.; Nijhuis, T. A.; Visser, T.; Weckhuysen, B. M. Phys. Chem. Chem. Phys 2005, 7, 211.
16. Bruckner, A. Catal. Rev. Sci. Eng. 2003, 45, 97.
17. Bruckner, A. Chem. Commun. 2001, 2122.
18. Bruckner, A. Phys. Chem. Chem. Phys. 2003, 5, 4461.
19. Grunwaldt, J.-D.; Caravati, M.; Hannemann, S.; Baiker, A. Phys. Chem. Chem. Phys. 2004, 6, 3037.
20. Bowie, B. T.; Chase, D. B.; Griffiths, P. R. Appl. Spectrosc. 2000, 54, 200A.
21. Beetz, T. Soft X-ray diffraction imaging with and without lenses and radiation damage studies; Ph.D. Thesis, State University of New York, 2004.
22. Li, C.; Stair, P. C. Catal. Today 1997, 33, 353.
23. Gamez, P.; Arends, I. W. C. E.; Sheldon, R. A.; Reedijk, J. Adv. Synth. Catal. 2004, 346, 805.
24. Kau, L.-S.; Spira-Solomon, D. J.; Penner-Hahn, J. E.; Hodgson, K. E.; Solomon, E. I. J. Am. Chem. Soc. 1987, 109, 6433.
25. Lever, A. B. P. Inorganic Electronic Spectroscopy, 2nd ed.; Elsevier Science B. V.: Amsterdam, 1984.
26. Beetz, T.; Jacobsen, C. J. Synchrotron Radiat. 2002, 10, 280.
27. Jayanetti, S.; Mayanovic, R. A.; Anderson, A. J.; Bassett, W. A.; Chou, I.-M. J. Chem. Phys. 2001, 115, 954.
28. Jonah, C. D. Radiat. Res. 1995, 144, 141.