Infrared photorefractive polymers and their applications for imaging

Science

Volumn 279, Issue 5347, 1998, Pages 54-57

  Kippelen, B ^a   Marder, S R ^b,c   Hendrickx, E ^a   Maldonado, J L ^a   Guillemet, G ^a   Volodin, B L ^a   Steele, D D ^a   Enami, Y ^a   Sandalphon, ^a   Yao, Y J ^a   Wang, J F ^a   Rockel H ^b   Erskine, L ^b   Peyghambarian, N ^a  

^a UNIVERSITY OF ARIZONA   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BIREFRINGENCE; INFRARED IMAGING; SCATTERING; SEMICONDUCTOR LASERS; TRANSPARENCY;

DIPOLE MOMENT; PHOTOREFRACTIVE POLYMERS;

POLYMERS;

POLYMER;

ANISOTROPY; ARTICLE; DIODE; IMAGING SYSTEM; INFRARED RADIATION; LASER; LIGHT REFRACTION; POLYMERIZATION; PRIORITY JOURNAL; REFRACTION INDEX; SEMICONDUCTOR;

BIREFRINGENCE; COLORING AGENTS; DIAGNOSTIC IMAGING; IMAGE PROCESSING, COMPUTER-ASSISTED; INFRARED RAYS; LASERS; POLYMERS; REFRACTOMETRY; SCATTERING, RADIATION; TEMPERATURE;

EID: 15444345864     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.279.5347.54     Document Type: Article

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30. Supported by the U.S. Office of Naval Research (through the MURI Center CAMP), NSF, an international CNRS/NSF travel grant, the U.S. Air Force Office of Scientific Research, the U.S. Ballistic Missile Defense Organization, and a NATO travel grant. E.H. is a postdoctoral fellow of the Fund for Scientific Research-Flanders (Belgium). We thank A. Fort and M. Barzoukas from IPCMS (Strasbourg, France) for the dipole moment measurements, and P. M. Allemand for his help in the dielectric constant determination.