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Volumn 58, Issue 3, 1998, Pages 1130-1133

Ge/Si(001) Surface stress and interaction of dimer vacancy lines

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EID: 1542779698     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.1130     Document Type: Article
Times cited : (3)

References (20)
  • 1
    • 0028320030 scopus 로고
    • For a review on surface strain effects, please see M. B. Webb, Surf. Sci. 299/300, 454 (1994).
    • (1994) Surf. Sci. , vol.299-300 , pp. 454
    • Webb, M.1
  • 16
    • 0000829523 scopus 로고
    • V. I. Marchenko, Pis’ma Zh. Eksp. Teor. Fiz. 33, 397 (1981) [JETP Lett. 33, 381 (1981)].
    • (1981) JETP Lett. , vol.33 , pp. 381
    • Marchenko, V.1
  • 18
    • 0000859459 scopus 로고
    • Besides Köhler et al. (Ref. 5), and Wu et al. [F. Wu, X. Chen, Z. Y. Zhang, and M. G. Lagally, Phys. Rev. Lett. 74, 574 (1995)] also measured the Ge overlayer thickness vs DVL periodicity. Three measurements agree reasonably well.
    • (1995) Phys. Rev. Lett. , vol.74 , pp. 574
    • Wu, F.1    Chen, X.2    Zhang, Z.3    Lagally, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.