Intelligent image correlation using genetic algorithms for measuring surface displacements and strain profiles

ASME International Mechanical Engineering Congress and Exposition, Proceedings

Volumn 2, Issue , 2001, Pages 1027-1034

  Pilch, Alan ^a   Maudlin, Jay ^a   Mahajan, Ajay ^a   Chu, Tsuchin ^a  

^a Southern Illinois University Carbondale   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTATIONAL METHODS; CONVERGENCE OF NUMERICAL METHODS; CORRELATION METHODS; DEFORMATION; GENETIC ALGORITHMS; HOLOGRAPHIC INTERFEROMETRY; INTERPOLATION; SPECKLE; STRAIN;

INTELLIGENT IMAGE CORRELATION; SURFACE DISPLACEMENTS;

IMAGE PROCESSING;

EID: 1542726422     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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