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Volumn 95, Issue 12, 1998, Pages 1559-1565

Morphologie et structure des faces (0001) et (1̄012) de l'alumine étudiées par RHEED et AFM

Author keywords

[No Author keywords available]

Indexed keywords


EID: 1542682581     PISSN: 00351563     EISSN: None     Source Type: Journal    
DOI: 10.1051/metal/199895121559     Document Type: Article
Times cited : (2)

References (10)
  • 1
    • 85034481996 scopus 로고    scopus 로고
    • Caractérisation de leur interface avec un dépôt de Pd. Thèse Doctorat. Université AixMarseille III juillet
    • 3 α et MgO. Caractérisation de leur interface avec un dépôt de Pd. Thèse Doctorat. Université AixMarseille III (juillet 1997).
    • (1997) 3 Α et MgO
    • Bruna, J.C.1
  • 2
    • 0030147721 scopus 로고    scopus 로고
    • Characterization of cleaved MgO (100) surfaces
    • ABROPI (D.), CREUSET ((F.), JUPILLE (J.). - Characterization of cleaved MgO (100) surfaces. Surf. Sci., 352-354 (1996), p. 499-503.
    • (1996) Surf. Sci. , vol.352-354 , pp. 499-503
    • Abropi, D.1    Creuset, F.2    Jupille, J.3
  • 4
    • 0019092757 scopus 로고
    • The attachment energy as a habit controlling factor III. Application to corundum
    • HARTMAN (P.). - The attachment energy as a habit controlling factor III. Application to corundum, J. Cryst. Growth, 49 (1980), p. 166-70.
    • (1980) J. Cryst. Growth , vol.49 , pp. 166-170
    • Hartman, P.1
  • 5
    • 0021727167 scopus 로고
    • Surfaces of magnesia and alumina
    • TASKER (P.W.). - Surfaces of magnesia and alumina. Adv. Ceram., 10 (1984), p. 176-188.
    • (1984) Adv. Ceram. , vol.10 , pp. 176-188
    • Tasker, P.W.1
  • 9
    • 0026899667 scopus 로고
    • Characterization of sapphire surfaces by energy loss spectroscopy
    • GILLET (E.), EALET (B.). - Characterization of sapphire surfaces by energy loss spectroscopy. Surf. Sci., 273 (1992), p. 427.
    • (1992) Surf. Sci. , vol.273 , pp. 427
    • Gillet, E.1    Ealet, B.2
  • 10
    • 84957235002 scopus 로고
    • Imaging polished sapphire with atomic force microscopy
    • BARRETT (R.C.), QUATE (C.F.). - Imaging polished sapphire with atomic force microscopy. J. of Vac. Sc. Techn., A8 (1990), p. 400.
    • (1990) J. of Vac. Sc. Techn. , vol.A8 , pp. 400
    • Barrett, R.C.1    Quate, C.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.