Data dependence analysis in automated test generation

Proceedings of the IASTED International Conference on Software Engineering and Applications

Volumn 7, Issue , 2003, Pages 476-481

  Korel, Bogdan ^a   Chung, Sunhwa ^a   Apirukvorapinit, Paskorn ^a  

^a Illinois Institute of Technology   (United States)

Author keywords

Chaining approach; Data dependence graph; Execution oriented generation; Test data generation

Indexed keywords

ALGORITHMS; COMPUTER SOFTWARE; DATA FLOW ANALYSIS; DATA REDUCTION; GRAPHIC METHODS; PROBLEM SOLVING;

CHAINING APPROACH; DATA DEPENDENCE GRAPH; EXECUTION-ORIENTED GENERATION; TEST DATA GENERATION;

OBJECT ORIENTED PROGRAMMING;

EID: 1542643427     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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