In situ X-ray diffraction investigation of porous silicon strains induced by the freezing of a confined organic fluid

European Physical Journal B

Volumn 16, Issue 3, 2000, Pages 447-454

  Faivre, C ^b   Bellet, D ^a,b   Dolino, G ^b  

^a Grenoble INP Phelma   (France)

^b UNIV GRENOBLE ALPES   (France)

Author keywords

61.10. i X ray diffraction and scattering; 61.43.Gt Powders, porous materials; 64.70.Dv Solid liquid transitions

Indexed keywords

EID: 1542636653     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510070202     Document Type: Article

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