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Volumn 123, Issue 2, 1996, Pages 391-397
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Preparation of Ag5-xTe3 thin films and confirmation of their crystal structure by high resolution electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 1542624608
PISSN: 00224596
EISSN: None
Source Type: Journal
DOI: 10.1006/jssc.1996.0194 Document Type: Article |
Times cited : (15)
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References (20)
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