메뉴 건너뛰기




Volumn 123, Issue 2, 1996, Pages 391-397

Preparation of Ag5-xTe3 thin films and confirmation of their crystal structure by high resolution electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 1542624608     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1006/jssc.1996.0194     Document Type: Article
Times cited : (15)

References (20)
  • 3
    • 85029971623 scopus 로고
    • Ph.D. Thesis. University of Zürich
    • J. R. Günter and P. Keusch, Ultramicroscopy 49, 293 (1993); P. Keusch, Ph.D. Thesis. University of Zürich, 1992.
    • (1992)
    • Keusch, P.1
  • 4
    • 85029962026 scopus 로고
    • Ph.D. Thesis. University of Zürich
    • W. Kälin, Ph.D. Thesis. University of Zürich, 1995.
    • (1995)
    • Kälin, W.1
  • 5
    • 85029967167 scopus 로고
    • Ph.D. Thesis. Westfälische Wilhelms-Universität, Münster
    • J. Peters, Ph.D. Thesis. Westfälische Wilhelms-Universität, Münster, 1982; J. Peters, O. Kourad, and B. Krebs, Z. Anorg. Allg. Chem., in press.
    • (1982)
    • Peters, J.1
  • 19
    • 0003693963 scopus 로고
    • (C. E. H. Bawn, H. Fröhlich, P. B. Hirsch, and N. F. Mott, Eds.). Clarendon, Oxford
    • J. C. H. Spence, in "Experimental High Resolution Electron Microscopy" (C. E. H. Bawn, H. Fröhlich, P. B. Hirsch, and N. F. Mott, Eds.). Clarendon, Oxford, 1981.
    • (1981) Experimental High Resolution Electron Microscopy
    • Spence, J.C.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.