Electronic states of a clean Si(110) 16×2 surface studied by angle resolved photoemission and surface differential reflectivity

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 4, 1996, Pages 2448-2453

  Cricenti, A ^a   Nesterenko, B ^b   Perfetti, P ^a   LeLay, G ^c   Sebenne, C ^d  

^a CNR   (Italy)

^b Ukraine   (Ukraine)

^c CAMPUS DE LUMINY   (France)

^d CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1542580491     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580035     Document Type: Article

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