New edge dependent deinterlacing algorithm based on horizontal edge pattern

IEEE Transactions on Consumer Electronics

Volumn 49, Issue 4, 2003, Pages 1508-1512

  Park, Min Kyu ^b   Kang, Moon Gi ^b   Nam, Kichul ^a   Oh, Sang Gun ^a  

^a SAMSUNG Electronics   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

Deinterlacing; Edge dependent interpolation; Edge pattern; I to P conversion

Indexed keywords

ALGORITHMS; INTERPOLATION; MATHEMATICAL MODELS; PATTERN MATCHING; VISUALIZATION;

EDGE DEPENDENT DEINTERLACING ALGORITHM; EDGE DEPENDENT INTERPOLATION; HORIZONTAL EDGE PATTERN;

EDGE DETECTION;

EID: 1542542449     PISSN: 00983063     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCE.2003.1261260     Document Type: Article

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