Structure of the Polytypic β-Form of P3N3(OCH2CF2CF2CH 2O)F4

Acta Crystallographica Section B: Structural Science

Volumn 52, Issue 4, 1996, Pages 643-650

  Wang, Z ^a   Willett, R D ^a   Elias, A J ^b   Kirchmeier, R L ^b   Shreeve, J M ^b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b UNIVERSITY OF IDAHO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1542505635     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108768195016089     Document Type: Article

References (4)

1. Elias, A. J., Kirchmeier, R. L. & Shreeve, J. M. (1994). Inorg. Chem. 33, 2727-2734.
2. Elias, A. J., Kirchmeier, R. L., Shreeve, J. M. & Hope, H. (1994). Inorg. Chem. 33, 415-420.
3. Sheldrick, G. M. (1991). SHELXTL-Plus. Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
4. Siemens. (1992). XSCANS92. Version 2.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.