Using Textile Topography To Analyze X-Ray CT Data of Composite Microstructure

Polymer Composites

Volumn 24, Issue 2, 2003, Pages 212-220

  Parnas, Richard S ^a   Wevers, Martine ^b   Verpoest, Ignaas ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTERIZED TOMOGRAPHY; IMAGE ANALYSIS; REINFORCEMENT; SIGNAL TO NOISE RATIO; TEXTILE FIBERS; X RAY ANALYSIS;

TEXTILE TOPOGRAPHY; X-RAY IMAGING;

COMPOSITE MATERIALS;

EID: 1542500682     PISSN: 02728397     EISSN: None     Source Type: Journal    
DOI: 10.1002/pc.10022     Document Type: Conference Paper

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