XPS determination of thin overlayer thickness

Doklady Akademii Nauk

Volumn 353, Issue 5, 1997, Pages 628-630

  Nefedov, V I ^a   Fedorova, I S ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1542494838     PISSN: 08695652     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. Fulghum J.E. // Surf. Interface Anal. 1993. V. 20. P. 161-175.
2. Nefedov V.I. X-Ray Photoelectron Spectroscopy of Solid Surfaces. Utrecht: VSP, 1988.
3. Baschenko O.A., Nefedov V.I. // J. Electron Spectrosc. Relat. Phenom. 1979. V. 17. P. 409-420.
4. Baschenko O.A., Nefedov V.I. // J. Electron Spectrosc. Relat. Phenom. Ibid. 1980. V. 21. P. 153-169.
5. Baschenko O.A., Nefedov V.I. // J. Electron Spectrosc. Relat. Phenom. Ibid. 1982. V. 27. P. 109-118.
6. Nefedov V.I., Fedorova I.S. // J. Electron. Spectrosc. (in press).
7. Baschenko O.A., Machavariani G.V., Nefedov V.I. // J. Electron. Spectrosc. Relat. Phenom. 1984. V. 34. P. 305-308.