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Volumn 146, Issue 5-6, 1998, Pages 223-229

Scanning Electron Microscopical Observation and X-ray Microanalysis of Erysiphe pisi DC on Infected Leaves of Pea (Pisum sativum L)

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EID: 1542494403     PISSN: 09311785     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1439-0434.1998.tb04683.x     Document Type: Article
Times cited : (7)

References (19)
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