Critical Analysis of the PIE Testability Technique

Software Quality Journal

Volumn 10, Issue 4, 2002, Pages 331-354

  Al Khanjari, Zuhoor ^a   Woodward, Martin ^b   Ramadhan, Haider Ali ^a  

^a SULTAN QABOOS UNIVERSITY   (Oman)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Infection; Mutant schemata; PIE technique; Sensitivity; Testability

Indexed keywords

SOFTWARE ENGINEERING;

INFECTION; MUTANT SCHEMATA; PIE TECHNIQUE; SENSITIVITY; TESTABILITY;

ELECTROMAGNETIC WAVE ATTENUATION;

EID: 1542491113     PISSN: 09639314     EISSN: 15731367     Source Type: Journal    
DOI: 10.1023/A:1022190021310     Document Type: Article

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