Step rearrangement upon low pressure oxidation of the Pt3Ti(510) surface: A study by scanning tunneling microscopy

Surface Review and Letters

Volumn 10, Issue 6, 2003, Pages 861-866

  Kurzina, I ^a,e   Shevlyuga, V ^b   Atrei, A ^c   Cortigiani, B ^d   Rovida, G ^d   Bardi, U ^d  

^a TOMSK STATE UNIVERSITY OF ARCHITECTURE AND BUILDING   (Russian Federation)

^b PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^c UNIVERSITY OF SIENA   (Italy)

^d UNIVERSITY OF FLORENCE   (Italy)

^e INST DE RECHERCHES SUR LA CATALYSE   (France)

Author keywords

Alloy; Oxidation; Platinum; Stepped surface; STM; Titanium

Indexed keywords

LOW ENERGY ELECTRON DIFFRACTION; OXIDATION; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC SCALE; PRESSURE OXIDATION;

PLATINUM COMPOUNDS;

PLATINUM; TITANIUM; TITANIUM DIOXIDE;

ARTICLE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; FILM; HYPOBARISM; LOW ENERGY ELECTRON DIFFRACTION; LOW ENERGY RADIATION; ORIENTATION; OXIDATION; PRESSURE MEASUREMENT; RADIATION SCATTERING; REACTION ANALYSIS; SCANNING TUNNELING MICROSCOPY; SEPARATION TECHNIQUE; SURFACE PROPERTY; TEMPERATURE MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 1542410405     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X03005633     Document Type: Article

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